Improving Soybean White Mold Control: Integrated Management and Breeding for Resistance

2020

  • Richard W. Webster
  • Megan McCaghey
  • Brian Mueller
  • John Gaska
  • Daren S. Mueller
  • Martin I. Chilvers
  • Shawn Conley
  • Damon L. Smith
  • University of Wisconsin, Madison, Department of Plant Pathology
  • University of California, Davis, Department of Plant Pathology
  • University of Wisconsin, Madison, Department of Plant Pathology
  • University of Wisconsin, Madison, Department of Plant Pathology
  • Iowa State University, Department of Plant Pathology and Microbiology
  • Michigan State University, Department of Plant, Soil and Microbial Sciences
  • University of Wisconsin, Madison, Department of Plant Pathology
  • University of Wisconsin, Madison, Department of Plant Pathology
Project Media

White mold of soybean is caused by the fungal pathogen, Sclerotinia sclerotiorum, and is a devastating disease in the Great Lakes growing region of the United States. The integrated management techniques used to control this disease are multi-level including the manipulation of row spacing, adjusting planting population, and using fungicides along with genetically resistant cultivars.

There is a significant need to test all combinations of control strategies together to measure the full effect on white mold control. Thus, the objective of our current work are as follows:

  1. Improve management of white mold by determining the greatest methods for reducing disease pressure.
  2. Develop soybean lines with high white mold resistance while also retaining favorable agronomic traits.